A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Silent silicon defects may cause modern CPUs and GPUs to produce incorrect results without crashing, raising concerns about ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

With a new mathematical model, a team of biophysicists has revealed fresh insights into how biological tissues are shaped by the active motion of structural imperfections known as "topological defects ...