Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.
This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
There is a great deal of activity in wide bandgap (WBG) power electronics lately, with Gallium Nitride (GaN) and Silicon Carbide (SiC) devices getting a lot of attention due to the technologies’ ...
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SAN FRANCISCO — Researchers from the Israel Institute of Technology have developed what the university claims is a “transistor in a test tube”, built via sequence-specific molecular lithography.
As questions persist about the longevity of Moore’s Law, an analyst has predicted some specific ways that Intel will keep it going for at least the next few years. Intel can continue to pack smaller ...
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