Duke Pratt School of Engineering

Study Finds Next-Generation Transistor Performance Inflated in Most Lab Testing

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
MIT Technology Review

How Thermal Transistors Could Control MEMs devices

In recent years, engineers have begun to design and test thermal transistors with some success. Their goal is to exercise the same control over heat that they already have over electric current–the ...
Electronic Design

Connecting Transistors— and Measuring Their Performance

Transistors are a dime a dozen—or maybe a dime a billion. When it comes to designing a state-of-the-art mobile device or a high-performance server, it’s how you put the transistors together that ...