Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...

The µHELIX® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 ...

A steady stream of advances has elevated test and measurement instruments to the point where they can reveal minute details of signals with lightning-quick rise and fall times. So, then, what about ...

One of the most basic tools for tinkering with electronics is a multimeter. Today, even a cheap meter has capabilities that would have been either very expensive or unobtainable back in the 1970s.

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...